Please use this identifier to cite or link to this item: https://hdl.handle.net/1959.11/60058
Title: Assessing radiometric corrections for UAS multi-spectral imagery in horticultural environments
Contributor(s): Tu, Yu-Hsuan (author); Phinn, Stuart (author); Johansen, Kasper (author); Robson, Andrew  (author)orcid 
Publication Date: 2018
DOI: 10.1109/IGARSS.2018.8517703
Handle Link: https://hdl.handle.net/1959.11/60058
Abstract: 

UAS-based multi-spectral imagery is becoming ubiquitous for monitoring and managing various horticultural crops. To accurately measure and monitor their structure and condition and estimate yields, appropriately corrected data must be used to drive the necessary algorithms. There are several popular radiometric correction methods commonly used for UAS-based data correction. However, their relative and absolute accuracies are not known. This study used three flight datasets, including along- and across-tree-row flight patterns in an avocado orchard. Four correction methods were applied to produce at-surface reflectance image mosaics for each flight pattern as well as the grid pattern and the results were compared to assess the reflectance consistency. Results show that no method provided consistently correct at-surface reflectance for the same features. A BRDF correction workflow was being developed to address these limitations. Preliminary application of the BRDF correction shows that it significantly improves the brightness consistency of features across different images.

Publication Type: Conference Publication
Conference Details: 2018 IEEE International Geoscience and Remote Sensing Symposium, Valencia, Spain, 22nd to 27th of July, 2018
Source of Publication: IGARSS 2018 - 2018 IEEE International Geoscience and Remote Sensing Symposium, p. 5453-5456
Publisher: The Institute of Electrical and Electronics Engineers, Inc
Place of Publication: United States of America
Fields of Research (FoR) 2020: 3002 Agriculture, land and farm management
Peer Reviewed: Yes
HERDC Category Description: E1 Refereed Scholarly Conference Publication
Publisher/associated links: https://ieeexplore.ieee.org/document/8517703
Appears in Collections:Conference Publication
School of Science and Technology

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