Please use this identifier to cite or link to this item: https://hdl.handle.net/1959.11/4204
Title: Calculating X-Ray Diffraction from Multilayer Lateral Crystal Structures with Arbitrary Shapes and Composition Profiles
Contributor(s): Punegov, V I (author); Maksimov, A I (author); Kolosov, S I (author); Pavlov, Konstantin M  (author)orcid 
Publication Date: 2007
DOI: 10.1134/S1063785007020101
Handle Link: https://hdl.handle.net/1959.11/4204
Abstract: A theory of x-ray diffraction in the vertical direction from a lateral crystal having an arbitrary shape and arbitrary depth-composition profile has been developed within the framework of the kinematic approximation. The results of a numerical simulation of diffraction patterns from such crystals in high-resolution triple-axis diffractometry scheme are presented.
Publication Type: Journal Article
Source of Publication: Technical Physics Letters, 33(2), p. 125-127
Publisher: MAIK Nauka - Interperiodica
Place of Publication: St Petersburg, Russia
ISSN: 1063-7850
Fields of Research (FoR) 2008: 020501 Classical and Physical Optics
Socio-Economic Objective (SEO) 2008: 861502 Medical Instruments
861503 Scientific Instruments
Peer Reviewed: Yes
HERDC Category Description: C1 Refereed Article in a Scholarly Journal
Appears in Collections:Journal Article

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