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Please use this identifier to cite or link to this item: https://hdl.handle.net/1959.11/29366
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dc.contributor.authorJnanamurthy, H Ken
dc.contributor.authorRaoul, Jetleyen
dc.contributor.authorHenskens, Fransen
dc.contributor.authorPaul, Daviden
dc.contributor.authorWallis, Marken
dc.contributor.authorSudarsan, S Den
dc.date.accessioned2020-09-02T01:34:03Z-
dc.date.available2020-09-02T01:34:03Z-
dc.date.issued2019-
dc.identifier.citationProceedings of the 20th IEEE International Conference on Industrial Technology (ICIT), p. 773-779en
dc.identifier.urihttps://hdl.handle.net/1959.11/29366-
dc.description.abstractThe detection of software clones is gaining more attention due to the advantages it can bring to software maintenance. Clone detection helps in code optimization (code present in multiple locations can be updated and optimized once), bug detection (discovering bugs that are copied to various locations in the code), and analysis of re-used code in software systems. There are several approaches to detect clones at the code level, but existing methods do not address the issue of clone detection in the PLC-based IEC 61131-3 languages. In this paper, we present a novel approach to detect clones in PLC-based IEC 61131-3 software using semantic-based analysis. For the semantic analysis, we use I/O based dependency analysis to detect PLC program clones. Our approach is a semantic-based technique to identify clones, making it feasible even for large code bases. Further, experiments indicate that the proposed method is successful in identifying software clones.en
dc.languageenen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.relation.ispartofProceedings of the 20th IEEE International Conference on Industrial Technology (ICIT)en
dc.titleAnalysis of Industrial Control System Software to Detect Semantic Clonesen
dc.typeConference Publicationen
dc.relation.conferenceICIT 2019: 20th IEEE International Conference on Industrial Technologyen
dc.identifier.doi10.1109/ICIT.2019.8754957en
local.contributor.firstnameH Ken
local.contributor.firstnameJetleyen
local.contributor.firstnameFransen
local.contributor.firstnameDaviden
local.contributor.firstnameMarken
local.contributor.firstnameS Den
local.subject.for2008080309 Software Engineeringen
local.subject.for2008080109 Pattern Recognition and Data Miningen
local.subject.seo2008890299 Computer Software and Services not elsewhere classifieden
local.profile.schoolSchool of Science and Technologyen
local.profile.emailjnanamurthy.hogavanaghattakumarswamy@uon.edu.auen
local.profile.emailraoul.jetley@in.abb.comen
local.profile.emailfrans.henskens@newcastle.edu.auen
local.profile.emaildpaul4@une.edu.auen
local.profile.emailmark.wallis@newcastle.edu.auen
local.profile.emailsudarsan.sd@in.abb.comen
local.output.categoryE1en
local.record.placeauen
local.record.institutionUniversity of New Englanden
local.date.conference13th - 15th February, 2019en
local.conference.placeMelbourne, Australiaen
local.publisher.placePiscataway, United States of Americaen
local.format.startpage773en
local.format.endpage779en
local.identifier.scopusid85069046656en
local.peerreviewedYesen
local.contributor.lastnameJnanamurthyen
local.contributor.lastnameRaoulen
local.contributor.lastnameHenskensen
local.contributor.lastnamePaulen
local.contributor.lastnameWallisen
local.contributor.lastnameSudarsanen
dc.identifier.staffune-id:dpaul4en
local.profile.orcid0000-0002-2428-5667en
local.profile.roleauthoren
local.profile.roleauthoren
local.profile.roleauthoren
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local.identifier.unepublicationidune:1959.11/29366en
dc.identifier.academiclevelAcademicen
dc.identifier.academiclevelAcademicen
dc.identifier.academiclevelAcademicen
dc.identifier.academiclevelAcademicen
dc.identifier.academiclevelAcademicen
dc.identifier.academiclevelAcademicen
local.title.maintitleAnalysis of Industrial Control System Software to Detect Semantic Clonesen
local.output.categorydescriptionE1 Refereed Scholarly Conference Publicationen
local.relation.urlhttp://www.ieee-icit2019.org/index.phpen
local.relation.urlhttps://ieeexplore.ieee.org/document/8754957/authors#authorsen
local.conference.detailsICIT 2019: 20th IEEE International Conference on Industrial Technology, Melbourne, Australia, 13th - 15th February, 2019en
local.search.authorJnanamurthy, H Ken
local.search.authorRaoul, Jetleyen
local.search.authorHenskens, Fransen
local.search.authorPaul, Daviden
local.search.authorWallis, Marken
local.search.authorSudarsan, S Den
local.uneassociationYesen
dc.date.presented2019-02-
local.atsiresearchNoen
local.conference.venueMelbourne Convention and Exhibition Centreen
local.sensitive.culturalNoen
local.year.published2019en
local.year.presented2019en
local.fileurl.closedpublishedhttps://rune.une.edu.au/web/retrieve/a7a8eb4a-d153-462e-8235-969ab9d9c796en
local.subject.for2020460207 Modelling and simulationen
local.subject.for2020460104 Applications in physical sciencesen
local.subject.seo2020220402 Applied computingen
dc.notification.token39b89490-2d2b-4131-9b1d-b4fa258840cden
local.codeupdate.date2021-11-01T11:01:19.283en
local.codeupdate.epersondpaul4@une.edu.auen
local.codeupdate.finalisedtrueen
local.original.for2020undefineden
local.original.for2020undefineden
local.original.seo2020undefineden
local.date.start2019-02-13-
local.date.end2019-02-15-
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School of Science and Technology
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