Please use this identifier to cite or link to this item: https://hdl.handle.net/1959.11/9753
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dc.contributor.authorNguyen, Vuen
dc.contributor.authorBlumenstein, Michaelen
dc.contributor.authorLeedham, Grahamen
local.source.editorEditor(s): Bob Werneren
dc.date.accessioned2012-03-20T10:21:00Z-
dc.date.issued2009-
dc.identifier.citationProceedings of the 10th International Conference on Document Analysis and Recognition, p. 1300-1304en
dc.identifier.isbn9781424445004en
dc.identifier.isbn9780769537252en
dc.identifier.issn1520-5363en
dc.identifier.urihttps://hdl.handle.net/1959.11/9753-
dc.description.abstractGlobal features based on the boundary of a signature and its projections are described for enhancing the process of automated signature verification. The first global feature is derived from the total 'energy' a writer uses to create their signature. The second feature employs information from the vertical and horizontal projections of a signature, focusing on the proportion of the distance between key strokes in the image, and the height/width of the signature. The combination of these features with the Modified Direction Feature (MDF) and the ratio feature showed promising results for the off-line signature verification problem. When being trained using 12 genuine specimens and 400 random forgeries taken from a publicly available database, the Support Vector Machine (SVM) classifier obtained an average error rate (AER) of 17.25%. The false acceptance rate (FAR) for random forgeries was also kept as low as 0.08%.en
dc.languageenen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.relation.ispartofProceedings of the 10th International Conference on Document Analysis and Recognitionen
dc.titleGlobal Features for the Off-Line Signature Verification Problemen
dc.typeConference Publicationen
dc.relation.conferenceICDAR 2009: 10th International Conference on Document Analysis and Recognitionen
dc.identifier.doi10.1109/ICDAR.2009.123en
dc.subject.keywordsPattern Recognition and Data Miningen
dc.subject.keywordsComputer Visionen
local.contributor.firstnameVuen
local.contributor.firstnameMichaelen
local.contributor.firstnameGrahamen
local.subject.for2008080109 Pattern Recognition and Data Miningen
local.subject.for2008080104 Computer Visionen
local.subject.seo2008890299 Computer Software and Services not elsewhere classifieden
local.profile.schoolSchool of Science and Technologyen
local.profile.emailcleedham@une.edu.auen
local.output.categoryE1en
local.record.placeauen
local.record.institutionUniversity of New Englanden
local.identifier.epublicationsrecordune-20110413-09253en
local.date.conference26th - 29th July, 2009en
local.conference.placeBarcelona, Spainen
local.publisher.placeLos Alamitos, United States of Americaen
local.format.startpage1300en
local.format.endpage1304en
local.identifier.scopusid71249104257en
local.peerreviewedYesen
local.contributor.lastnameNguyenen
local.contributor.lastnameBlumensteinen
local.contributor.lastnameLeedhamen
dc.identifier.staffune-id:cleedhamen
local.profile.roleauthoren
local.profile.roleauthoren
local.profile.roleauthoren
local.identifier.unepublicationidune:9944en
dc.identifier.academiclevelAcademicen
local.title.maintitleGlobal Features for the Off-Line Signature Verification Problemen
local.output.categorydescriptionE1 Refereed Scholarly Conference Publicationen
local.relation.urlhttp://www.cvc.uab.es/icdar2009/papers/3725b300.pdfen
local.conference.detailsICDAR 2009: 10th International Conference on Document Analysis and Recognition, Barcelona, Spain, 26th - 29th July, 2009en
local.search.authorNguyen, Vuen
local.search.authorBlumenstein, Michaelen
local.search.authorLeedham, Grahamen
local.uneassociationUnknownen
local.year.published2009en
local.date.start2009-07-26-
local.date.end2009-07-29-
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