Please use this identifier to cite or link to this item: https://hdl.handle.net/1959.11/10709
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dc.contributor.authorShankar, Ben
dc.contributor.authorHadley, Daviden
dc.date.accessioned2012-07-17T09:38:00Z-
dc.date.issued2005-
dc.identifier.citationThe Empirical Economics Letters, 4(3), p. 1-10en
dc.identifier.issn1681-8997en
dc.identifier.urihttps://hdl.handle.net/1959.11/10709-
dc.description.abstractThe input-based radial measure of technical inefficiency can be interpreted as the extent of input overuse by a firm. In recent years, researchers in applied economics have been particularly interested in overuse estimates for the subset of inputs (e.g. polluting agrochemical use in agriculture), and have used the radial measure constructed using Data Envelopment Analysis for such estimation. The problem of 'slacks' can, however, be severe in Data Envelopment Analysis. One of the solutions available is the 'Russell' nonradial measure that provides 'slack-free' technical efficiency estimates. Some authors researching subset input overuse have therefore used the Russell instead. We argue here that the Russell is not a suitable tool when the objective is to highlight the extent of overuse in a subset of inputs (e.g., polluting chemicals in agricultural production). We present three arguments in this demonstration, and use numerical examples and an empirical application based on UK cereal production to illustrate.en
dc.languageenen
dc.publisherUniversity of Rajshahien
dc.relation.ispartofThe Empirical Economics Lettersen
dc.titleOn the Measurement of Subset Input Overuse Using Data Envelopment Analysisen
dc.typeJournal Articleen
dc.subject.keywordsEconomic Models and Forecastingen
dc.subject.keywordsAgricultural Economicsen
local.contributor.firstnameBen
local.contributor.firstnameDaviden
local.subject.for2008140201 Agricultural Economicsen
local.subject.for2008140303 Economic Models and Forecastingen
local.subject.seo2008910210 Productionen
local.profile.schoolUNE Business Schoolen
local.profile.emaildhadley@une.edu.auen
local.output.categoryC1en
local.record.placeauen
local.record.institutionUniversity of New Englanden
local.identifier.epublicationsrecordune-20120702-125132en
local.publisher.placeIndiaen
local.format.startpage1en
local.format.endpage10en
local.peerreviewedYesen
local.identifier.volume4en
local.identifier.issue3en
local.contributor.lastnameShankaren
local.contributor.lastnameHadleyen
dc.identifier.staffune-id:dhadleyen
local.profile.orcid0000-0001-8634-2586en
local.profile.roleauthoren
local.profile.roleauthoren
local.identifier.unepublicationidune:10904en
dc.identifier.academiclevelAcademicen
local.title.maintitleOn the Measurement of Subset Input Overuse Using Data Envelopment Analysisen
local.output.categorydescriptionC1 Refereed Article in a Scholarly Journalen
local.search.authorShankar, Ben
local.search.authorHadley, Daviden
local.uneassociationUnknownen
local.year.published2005en
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