Please use this identifier to cite or link to this item: https://hdl.handle.net/1959.11/8291
Title: Mask-assisted deterministic phase-amplitude retrieval from a single far-field intensity diffraction pattern: Two experimental proofs of principle using visible light
Contributor(s): Podorov, Sergey G (author); Bishop, Alexis I (author); Paganin, David M (author); Pavlov, Konstantin M  (author)orcid 
Publication Date: 2011
DOI: 10.1016/j.ultramic.2011.01.011
Handle Link: https://hdl.handle.net/1959.11/8291
Abstract: We recently developed a simple closed-form algorithm, which allows one to reconstruct the complex scalar wavefield at the exit surface of a sample, from the intensity of its far-field coherent diffraction pattern which is obtained in the presence of a suitable object-plane mask. In the first variant of this algorithm, the sample is contained within a uniformly illuminated sharp rectangular aperture in which at least one transverse dimension is at least twice that of the object. In the second variant, the sample is uniformly illuminated and is transversely displaced from an opaque rectangular mask in the object plane. For both variants, the far-field diffraction pattern is first Fourier transformed and then differentiated with respect to both transverse coordinates, in order to deterministically yield a series of independent reconstructions of the sample. Here we give an experimental demonstration of each of these two variants of our technique, using visible light.
Publication Type: Journal Article
Source of Publication: Ultramicroscopy, 111(7), p. 782-787
Publisher: Elsevier BV
Place of Publication: Netherlands
ISSN: 1879-2723
0304-3991
Fields of Research (FoR) 2008: 020599 Optical Physics not elsewhere classified
020402 Condensed Matter Imaging
029999 Physical Sciences not elsewhere classified
Socio-Economic Objective (SEO) 2008: 861503 Scientific Instruments
Peer Reviewed: Yes
HERDC Category Description: C1 Refereed Article in a Scholarly Journal
Appears in Collections:Journal Article

Files in This Item:
2 files
File Description SizeFormat 
Show full item record

SCOPUSTM   
Citations

6
checked on Jul 27, 2024

Page view(s)

1,200
checked on Aug 4, 2024
Google Media

Google ScholarTM

Check

Altmetric


Items in Research UNE are protected by copyright, with all rights reserved, unless otherwise indicated.