https://hdl.handle.net/1959.11/31719
Title: | Multi-level analysis of IEC 61131-3 languages to detect clones | Contributor(s): | Jnanamurthy, H K (author); Jetley, Raoul (author); Henskens, Frans (author); Paul, David (author) ; Wallis, Mark (author); Sudarsan, S D (author) | Publication Date: | 2020 | Early Online Version: | 2020-10-19 | DOI: | 10.1504/IJCAT.2020.110413 | Handle Link: | https://hdl.handle.net/1959.11/31719 | Abstract: | Publication Type: | Journal Article | Source of Publication: | International Journal of Computer Applications in Technology, 63(4), p. 286-299 | Publisher: | Inderscience Publishers | Place of Publication: | Switzerland | ISSN: | 1741-5047 0952-8091 |
Fields of Research (FoR) 2020: | 460104 Applications in physical sciences 460207 Modelling and simulation |
Socio-Economic Objective (SEO) 2020: | 220402 Applied computing | Peer Reviewed: | Yes | HERDC Category Description: | C1 Refereed Article in a Scholarly Journal |
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Appears in Collections: | Journal Article School of Science and Technology |
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