Author(s) |
Vine, JD
Paganin, DM
Pavlov, Konstantin M
Kräußlich, J
Wehrhan, O
Uschman, I
Förster, E
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Publication Date |
2007
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Abstract |
We have performed an analyzer crystal based phase contrast imaging (ABI) experiment using a rotating anode x-ray source. The use of such an incoherent source demonstrates the potential of ABI as a quantitative characterization tool for the laboratory environment. A phase contrast image of a plastic phantom was recorded on high resolution x-ray film and the projected thickness was retrieved from a single image. The projected thickness recovered from the phase contrast image was shown to quantitatively agree with a reference optical microscope measurement.
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Citation |
Applied Physics Letters, v.91 (25)
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ISSN |
1077-3118
0003-6951
1520-8842
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Link | |
Publisher |
American Institute of Physics
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Title |
Analyzer-based phase contrast imaging and phase retrieval using a rotating anode x-ray source
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Type of document |
Journal Article
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Entity Type |
Publication
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